...测试应用时间 [gap=956]Keywords: core;wrapper chain;balance partition;best interchange decreasing;test application time ...
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Test compression can reduce test data volume and test application time of SoC without losing fault coverage.
测试压缩在保障测试质量前提下,能有效地减少测试数据量和测试时间,从而降低芯片的测试成本。
参考来源 - SoC低成本测试技术与实现方法研究·2,447,543篇论文数据,部分数据来源于NoteExpress
The proposed method USES the compatibility between test vectors to reduce test application time.
该方法利用了测试向量之间的相容性,降低测试应用时间。
Recently, reducing test application time and test data volume is a direction of effort in SoC design .
目前,减少测试应用时间和测试数据容量是测试领域的努力方向。
There are three serious problems: These are test application time, test data volume, and test power consumption.
其中比较严重的问题有三个:它们分别是测试时间、测试数据量和测试功耗。
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