The results show that the circuit model and the test generation algorithm are not only effective for generating test sequence but also can help for the testability analyse.
试验数据显示，该模型和测试生成算法不仅对生成测试序列是有效的，而且对于电路描述的可测性分析也有一定的帮助。
This paper proposes a new algorithm for computing the maximum distance sequence, which are general for VLSI circuit test and software test technique.
本文提出了求多个测试序列极大距离的算法，该算法对数字电路的测试和软件测试技术是通用的。
The test result shows that the accuracy of MSA-GSA has improved and the algorithm is effective in multiple sequence alignment.
经测试MS A - GSA算法精度有大幅提高，证明该算法在解决多序列比对问题上是行之有效的。
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