This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.

本文提出了产生数字电路测试码的一种算法——主路径敏化法。

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This paper proposes a generation method of path coverage test based on Gene Expression Programming(GEP) algorithm, compiler technology and Virtual Machine(VM).

提出一种基于基因表达式编程（GEP）算法、编译器技术、虚拟机技术的路径覆盖测试用例生成方法。

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This paper focuses on automatic test data generation for path testing using genetic algorithms.

本文主要研究的是路径测试数据的自动生成方法。

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