The Paper discusses the test system for material creep with advanced VXI instrument BUS.

介绍了具有先进VX I仪器总线的材料蠕变测试系统。

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This paper proposes a test plan that isolation material affects modul isolation voltage and analyzes the test results. In this paper sone important conclusions are inferred.

本文提出了绝缘材料对模块绝缘电压产生影响的试验方案，分析、讨论了试验结果，得出了一些重要结论。

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This instrument is an internation of single and multi-layer and cardboard corrugated cardboard, also can be used for silk, cotton, etc of non-paper-made material strength of resistance test.

式仪器，广泛地适用于包装材料，主要用于测定各种纸板及单层和多层瓦楞纸板，也可用于丝绸、棉布等非纸质材料的耐破强度的测试。

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