The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
This paper suggests a new method of rapid and automatic measuring the spectral diffraction efficiency curve of plane grating.
本文提出了一种快速自动测试平面光栅光谱衍射效率曲线的新方法。
A new method for measuring the spectral diffraction efficiency of plane grating with double-beam and single detector is suggested.
本文提出了一种双光束检测器测试平面光栅衍射效率的新方法。
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