The principle of memory built-in self-test is analyzed in detail and a typical implementation of MBIST is given in the paper.
文中详细分析了嵌入式存储器内建自测试的实现原理,并给出了存储器内建自测试的一种典型实现。
Based on an industry project, this paper presents the complete design flow of MBIST and gives the quantitative and qualitative discussion for the test overhead.
根据一个实际项目,本文介绍了MBIST的整体设计过程,并针对测试开销等给出了定量和定性的讨论。
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