This paper presents a hardware structure-independent weight-based fault injection model for accurate emulation of the radioresistance in the SRAM-based FPGA.
提出一种与具体硬件结构无关、基于权重的错误注入模型,用于准确模拟基于SRAM的现场可编程门阵列抗辐射性能。
In typical six-phase transmission system, half positive sequence, half zero sequence and half negative sequence fault components are independent of the variance of system impedance.
在典型的六相输电系统中,半正序、半零序和半负序故障分量不受系统阻抗变化的影响。
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