Fault injection emulation platform based on Joint Test Action Group (JTAG) boundary scan and dynamic partial reconfiguration is proposed.
提出基于JTAG边界扫描技术和动态局部重配置的错误注入模拟平台。
Joint test Action Group designed a common chip boundary-scan structure and test access port criterion which is called JTAG standard to support testing on-board chip or logic.
为支持板上芯片或逻辑的测试，联合测试行动小组专门设计和定义了一种通用的芯片边界扫描结构及其测试访问端口规范，称为JTAG标准。
应用推荐