Single Hard Errors and functional error were observed in SRAMs under proton irradiation. The explanation is reasonable for the relation between SHE and device integration scale.
实验观察到质子也可以导致存储器出现单个位的硬错误和器件功能错误，并对单个位的硬错误与器件集成度的关系提出了合理的解释。
The components are fully functional, but some essential features, such as data validation and error reporting, are missing.
这些组件功能丰富，但缺少一些基本功能，比如数据验证和错误报告。
Rational Functional Tester marks the test case as failed and provides, in the Problems view, a snapshot of the error reported.
Rational Functional Tester将测试用例标记为错误，并在问题视图中提供报告的错误的快照。
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