... film thickness change ==> 膜厚変化 film thickness dependence ==> 膜厚依存性 film thickness distribution ==> 膜厚分布 ...
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The film thickness dependence of island density shows that a maximum of island density appears at the critical film thickness for both substrates.
岛面密度与膜厚的依赖关系表明，在临界厚度时硅衬底和玻璃衬底上的岛面密度均出现了极大值。
It is found that the film thickness dependence of the dielectric nonlinearity is determined by that of the coercive electric field and the maximal polarization.
进一步分析发现，膜厚通过影响矫顽场强和最大极化强度进而影响铁电薄膜的电压非线性。
By use of the effective-field theory with correction, the dependence of the critical temperature of the Heisenberg film on the thickness, surfacte coupling of the film are investigated.
本文在相关有效场理论框架内，应用类伊辛模型分析方法，研究了海森堡薄膜的临界行为。
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