Ellipsometry is an optical analytical technique used to determine the optical constants and the film thickness from measurements of the change in polarization state of reflecting light.

椭圆偏振测量是一种通过分析偏振光在待测薄膜样品表面反射前后的偏振态的改变来获得薄膜材料的光学常数和薄膜厚度的高精度、非接触测量方法。

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Exposure energy will change with different CCL and the thickness of ink, so we must carry on experiment to confirm under-cut degree, exposure ruler limits 7-9 grade remnant film.

曝光能量会因基板及油墨厚度的不同而变更，请进行试验以确认侧蚀程度后再认定，曝光尺控制在7 - 9级残膜。

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