...子电工电力技术 Field Ion Microscopy,FIM) FIM 是于1951 年由Muller 所发明，其前身乃场发射显微术(Field Emission Microscopy,FEM)。
基于4个网页-相关网页
· =Federal (for specifications or standards)联邦的(用于规格或标准)[美] · =Field Emission Microscopy 场致发射显微镜 · = Federal Extension Service 联邦农业技术推广局([美]农业部) ..
基于2个网页-相关网页
field emission microscopy fem 场发射显微镜
Scanning anode field emission microscopy 扫描阳极场致发射显微镜
FEM Field Emission Microscopy 场致发射显微镜
Field emission scanning electron microscopy 扫描电子显微分析 ; 场发射扫描电子显微镜 ; 式电子显微镜 ; 电子显微镜
field electron emission microscopy 场电子发射显微术
field emission scan electronic microscopy 场发射扫描电子显微镜
field emission electron microscopy 场发射扫描电子显微镜
以上来源于: WordNet
The phase composition and microstructure of mullite powders were investigated by X-ray diffraction and field emission scanning election microscopy techniques.
利用X射线衍射仪和场致发射扫描电子显微镜等手段对合成粉体的相组成、结构和形貌进行了研究。
The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
The obtained products were characterized by powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and field-emission scanning electron microscopy (FE-SEM).
利用粉末X射线衍射（XRD）、扫描电镜（SEM）和场发射扫描电镜（FE-SEM）对所得产物进行表征。
应用推荐