A facility has been developed that can function as a low-energy electron point source (LEEPS) microscope or a field-emission microscope (FEM).

研制了一台集低能电子点源显微镜和场发射显微镜于一体的设备。

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A tungsten tip received discharge treatment under a high voltage over 10? KV in a field-emission microscope (FEM).

在场发射显微镜(FEM)中使用1万伏以上的电压对钨针尖进行了放电处理。

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