thin slice scan thickness 薄层扫描层厚
The wire sawing process has been applied to slice single silicon into thin wafers for its character of minimum warp, uniform thickness and low kerf loss.
由于线锯切割具有切片薄、表面翘曲变形小、厚薄均匀和切口损失小等优点,被广泛用于单晶硅切片加工。
The method comprises a step of removing a thin slice of the integrated circuit chip from part of the thickness along the direction vertical to the structure length.
所述方法包括以沿垂直于所述结构长度的方向的方式从所述厚度 的部分去除一所述集成电路芯片的薄片。
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