In this paper a method of measuring differential surface photovoltage spectrum with liquid probe has been reported.

本文报导了一种液体探针表面光电压微分谱测量方法。

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Single-beam surface photovoltage spectrum (SPS) apparatus can not avoid the error caused by the drift of light source intensity with time .

单光束表面光电压谱仪，当光源强度随时间发生漂移时，必然产生结果误差。

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They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).

对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。

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