The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
A method of frequency spectrum analysis is introduced, which be realized by collect the virtual value of appoint frequency vibration through scanning frequency.
介绍了一种用频率扫描抽取指定频率振动分量有效值的方法实现硬件频谱分析的工作原理。
Based on the analytic method of cyclic spectrum density, the paper pointed out that the impact frequency could be extracted effectively with the help of scanning cyclic frequency domain.
通过对循环谱密度分析方法的特性分析，指出应用循环谱密度分析方法可以在循环频率域有效提取出滚动轴承的冲击故障频率。
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