The samples were characterized by X-ray diffraction (XRD), Scanning electronic microscope (SEM), photoluminescence (PL) and X-ray excited luminescence (XEL) spectra.
分别以X-射线衍射(XRD)、扫描电子显微镜(SEM)、光致发光(PL)光谱及X-射线激发的发光(XEL)光谱对样品进行了表征。
We have measured the photoluminescence (PL) spectra of porous silicon which has been dipped into fluorescence_sodium liquid, then taken out and dried at room temperature.
在室温下,将多孔硅浸泡于不同浓度荧光素钠溶液中,取出晾干后对多孔硅光致发光谱(PL)进行了研究。
The morphology, structure, and photoluminescence(PL) of the phosphors were investigated by transmission electron microscope(TEM), X-ray diffraction(XRD), emission spectra, and decay time.
以X射线衍射(XRD)、透射电子显微镜(TEM)、发射光谱和衰减时间谱等手段表征材料性能。
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