The experimental principle and the method to measure the normal spectral emittance of materials by infrared spectrophotometer and microcomputer system are presented.
本文报道利用红外分光光度计和微机系统，采用二次测量技术，测量材料表面法向光谱发射率的基本原理和测试方法。
The calculative expression of normal spectral emittance is deduced. Some factors which cause the error are discussed Normal spectral emittance curves of several materials are measured.
推导出光谱发射率的计算公式，对引起测量误差的诸因素进行讨论，并实测了几种材料法向光谱发射率曲线。
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