The theory of the Newton ring method is analyzed and the chip warpage is measured by use of the Newton ring method.
分析了牛顿环法的测量原理，利用牛顿环法对芯片翘曲度进行了测量。
As a classical experiment, Newton ring experiment is usually used in measuring the radius of curvature of a lens.
牛顿环实验是大学物理实验中的一个基本实验，目前的实验只是用于测透镜曲率半径。
For the expansion of Newton ring experiment, two formula of measuring film thickness is proved according to the experimental principle, and the formula is also discussed.
本文对牛顿环实验进行拓展，根据实验原理推导出两个用于测定薄膜厚度的理论公式，并对公式进行了理论分析。
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