... ion-beam carving machine 离子束雕刻机 ion-beam probe 离子束探针 ion-chamber detector 电离室型探测器 ...
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ion beam probe 离子束探针
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If there was a problem with the chip, you could probe the metal directly to watch the circuitry, and, with a focused-ion-beam system, you could even rewire it.
如果芯片有问题,应该直接研究金属层来察看电路,而对于聚焦离子束系统则应该重新布线。
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