在熔点以上,利用 同步辐射高能 X 射线衍射(High Energy X-Ray Diffraction,HEXRD)对温度为 1250 K、1210 K、1175 K 和 1140 K 的 Cu80Si20 合金进行...
基于1个网页-相关网页
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
应用推荐