背光二极管暗电流(Back facet dark current) 正向电压测试(Forward Voltage Test) 该项测试用来检测当激光二极管输出光功率增加时，背光二极管(反向偏置)响应情况其感生电流的典型测量范围是0~100mA，分辩率100n...
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dc forward-voltage-drop test 直流正向压降测试
The Source-Measure Unit can also test other diode parameters, including forward voltage drop and breakdown voltage.
源-测量单元还可以测量其它的二极管参数，包括正向电压降和击穿电压。
A method based on pulse injection was put forward to test the light-current-voltage (LIV) characteristics of laser diode (LD), and a new type of pulse measurement system was developed.
为精确测试半导体激光器(LD)的光功率-电流-电压(LIV)特性，提出一种基于脉冲注入调制的方法，并据此研制新型的LD脉冲测试系统。
The method to test the variations of the wavelength of electrons using Kikuchi maps when the accelerating voltage is changed in the HEED experiment is put forward.
本文提出了在高能电子衍射实验中，当加速电压改变时利用菊池图测量电子波长变化值的方法。
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