The presented approach can not only diagnose both catastrophic faults and parametric faults, but also can be applied for both DC test and ac test.

该方法不仅能够同时诊断元件的硬故障和参数偏移故障，而且能够同时运用于直流测试和交流测试。

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Digital IC test content includes logic functional test, test of DC parameters and test of AC parameters.

数字集成电路测试内容包括逻辑功能测试、直流参数测试和交流参数测试。

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