...重庆大学》2005年硕士论文 微镜(Electrostatic Force Microscope，EFM) 23 2．5．4 化学力显微镜(Chemical Force Microscope，CFM) 23-24 2．5．5 激光力显微镜(Laser Force Microscope，LFM) ..
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The crystal was characterized by four-crystal X-ray diffraction, chemical etching, optical microscope, transmission spectra and atomic force microscope (AFM).
通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征。
The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).
并且分别利用原子力显微镜和傅立叶变换红外光谱对薄膜进行界面形态和微观结构分析。
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