boundary-scan technique 边界扫描技术
IEEE1149 standard and its. X sub standards are based on boundary scan technique, different standards can be appropriately selected for various of applications.
IEEE1149标准及其子标准是基于边界扫描的测试技术，它们针对不同的应用环境采用相应的技术标准。
Scan technique and boundary scan technique are the main stream technology of current DFT technique. They can solve the internal testable problems and the connection problems between ICs respectively.
扫描技术和边界扫描技术是目前可测试性设计的主流技术，可分别用来解决芯片内部与芯片之间的可测试性问题。
JTAG Boundary Scan is a new technique for connection test. With the help of JTAG, we can find out all connection faults of a complicated board or system.
JTAG边界扫描机制是用于在线导通测试的新技术，利用JTAG可以在数分钟内查出复杂插件和系统的全部导通故障。
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