... film recording thermograph照相温度（表） film sample薄膜样品 film varstor膜式电压敏电阻器 ...
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Comparing with semiconductor material,thin film samples have smaller resistivity and more fragile texture.
薄膜样品相比半导体材料,电阻更小且材质脆弱,现有的四探针电阻率测量设备无法满足其测量要求。
参考来源 - 基于虚拟仪器的薄膜电阻率自动测量系统·2,447,543篇论文数据，部分数据来源于NoteExpress
在紫外灯照射下，肉眼观看该薄膜样品，发出耀眼的蓝光。
The film sample emits brilliant blue light under ultraviolet light by naked eyes.
通过红外吸收谱的测量发现薄膜样品具有较好的红外吸收性能。
It is found that the thin films have good infrared absorption properties by infrared absorption spectrum.
采用VHF-PECVD技术制备了不同衬底温度的微晶硅薄膜样品。
Series of microcrystalline silicon thin films were fabricated by VHF-PECVD at different substrate temperatures (Ts).
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