为克服现有的透射电镜试样双喷电解减薄仪的缺点，自制了双喷电解减薄装置。
A home-made twin-jet electropolishing device for preparing transmission electron microscope(TEM)samples is reported.
通过扫描电镜图片对木材试样横纹剖面的多孔结构特征进行了观察，并利用分形理论对其进行了分析。
The porous structure of wood samples on their cross sections was observed using the scanning electron microscope (SEM) images and analyzed via the fractal theory.
用X射线衍射仪（XRD）以及扫描电镜（SEM）等研究了试样在不同预设升温速度下的相结构和显微组织。
The phase structure and microstructure of samples under different heating rates were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM) etc.
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