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在逻辑门电路测试技术中，可以在泛序测试法基础上建立故障诊断树，用于完成单电路故障的检测与定位诊断。
In the technologys of logic circuit test, we can use diagnosis tree to finish the test of logic element fault.
直流参数测试是集成电路测试技术的重要组成部分，能够快速有效的检测芯片的性能，受到集成电路测试行业的高度重视。
DC parametric testing is an important component of IC test, it has got more attention from IC test industry, because it could detect the performance of the IC quickly and efficiently.
本文介绍了解决现代电气化铁路轨道电路综合参数“在线”测试过程的技术难题。
It is given how to solve technical problem on track circuit synthetic parameters on-line measure in modern electric railway.
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