对磁谱仪和焦面探测器的联合系统的离子鉴别方法予以较详细的讨论。
The detailed descriptions are made for the particle identification of the combined systems of the spectrometer and the detectors.
本文介绍一种新的焦面检测方法，以位置敏感探测器P SD作为检焦器件对光学系统的实际焦面进行检测。
A new technique for measuring the accurate position of the focal plane of an optical system with position sensitive detector (PSD) is presented.
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