为快速有效地对集成电路设计中潜在的常见错误进行检测，提出一种基于静态分析的错误检测方法。
For detecting the potential common errors of integrated circuit designs quickly and efficiently, this paper introduces a novel error defection approach based on static analysis.
我们分析发现造成这种现象的物理原因是多模干涉区的自成像效应，这种多模干涉在光子晶体光学集成电路中具有重大的潜在应用价值。
We analyse the physical origins of this performance is the self-imaging principle in the multi-mode region, this kind of multi-mode interference may find potential application in PC optical circuits.
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