中国测试精选文章 关键词：测试生成算法；自动测试矢量生成；可测性设计；内建自测试；存储器测试；静态功耗电流 [gap=614]Key words：Test algorithms；ATPG；DFT；BIST；Memory testing；IDDQ
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那些传统的测试生成算法已不再适用。
Those traditional test generation algorithms are not applicable any more.
研究了组合电路中非鲁棒性路径时滞故障的测试生成算法。
The test generation algorithm for non-robust path delay fault in combinational circuits is studied.
然而，已有的电路并行测试生成算法并未取得理想的结果，尤其对时序电路。
However, the existing circuit parallel test generation algorithms fail get good results, especially for sequential circuit.
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