Their structures had been determined by Elemental analyses, IR, ~1H-NMR and ~(13)C-NMR spectroscopy and X-ray crystallography.
用核磁共振、红外光谱、X-衍射、元素分析等手段进行表征,培养单晶并测定了其晶体结构。
参考来源 - 锌氮、铜氮金属有机配合物的合成、表征及催化应用The barrier performances of double barriers with SiON and Ta layers and Ta barriers were tested by using second ion mass spectrometry(SIMS). Crystallography orientation structures of Cu films with and without Ta barriers were studied by using X-ray diffraction(XRD).
采用二次离子质谱仪(SIMS)测试了SiON和Ta双层扩散阻挡层及Ta扩散阻挡层的阻挡性能;采用X射线衍射仪(XRD)测量了沉积态有Ta阻挡层和无阻挡层Cu膜的晶体学取向结构;利用电子薄膜应力测试仪测量了具有双层阻挡层Cu膜的应力分布状况。
参考来源 - Cu金属化系统双扩散阻挡层的研究·2,447,543篇论文数据,部分数据来源于NoteExpress
以上来源于: WordNet
N the science concerned with the formation, properties, and structure of crystals 晶体学
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