Two methods, code density histogram and spectrum analysis FFT, are introduced, which are typically used to test dynamic parameters of ADC′s.

着重介绍了码密度直方图法和谱分析FFT法两种常用的ADC动态参数测试方法，指出了该领域未来的研究方向。

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Test data tends to have a higher error density than the code being tested.

测试数据本身出错的密度往往比被测代码还要高。

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