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The surface microstructure of anodic tantalum core was analyzed by scanning electron microscope (SEM), and then analyzed the failure mechanism of wet tantalum capacitor.
利用扫描电子显微镜(SEM)分析了阳极氧化后及产品失效后阳极钽芯表面介质膜的微观结构,并对液钽电容器失效机理进行了探讨。
The incomplete connection between the spray end of metallized capacitor and metal layer of polymer film is the main cause of capacitor damage and failure.
电容器端部喷金层与膜上金属蒸镀层的不完全连接性,是电容器损坏的主要原因之一。
The technical failure lies in ignoring the surge slot capacitor parallel connection with low value water cooling electric resistance, and induce abnormal power diffluence wasting.
技术上曾经的失误在于,因疏忽导致了不合理的振荡槽路电容等价并联低值冷却水路水电阻,形成异常功率分流附加损耗问题。
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