A new method for determining directly trace component in interfering base by absorbance subtraction -second derivative spectrophotometry is proposed.
对利用差谱—二阶导数分光光度法直接测定强干扰基体中微量组分的原理和实验方法进行了探讨。
A new method for determining directly trace component in interfering base by absorbance division-multi-wavelength linear regression spectrophotometry.
提出了用除谱-多波长线性回归分光光度法测定强干扰基体中微量组分的原理和实验方法。
Also the absorbance of nanabacteria was measured by Elisa to know its growth speed indirectly.
使用酶标仪动态检测纳米细菌的吸光度值，间接了解其生长速度。
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