A method of determining an optimum set of testable components in the fault diagnosis of analog linear circuits under K faults hypothesis is presented in the paper.

本文提出了在模拟线性电路故障诊断中k故障假设下一组最优可测试成份确定的方法。

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Based on the slope fault mode and the coefficient of linear relativity fault mode, a test nodes selection algorithm for soft fault diagnosis dictionary method of analog circuits was proposed.

基于斜率故障模型和线性相关系数故障模型，提出了一种模拟电路软故障诊断字典法中的测试节点优选算法。

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For linear analog circuits, the voltage relation function is a linear function and the slope can be the fault character to diagnose both catastrophic faults and parametric faults.

对于线性模拟电路，节点电压关系函数为一次函数，函数的斜率可以作为故障模型，同时可以诊断硬故障和参数(软)故障。

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