本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。

This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).

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验证是当前越来越复杂的集成电路设计中的瓶颈，在寄存器传输级（RTL）直接做验证是目前比较有效的一种途径。

Verification is the bottleneck of more and more complex integrated circuit designs, and doing verification directly on register transfer level (RTL) is a promising solution.

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集成电路设计在寄存器传输级的设计方法已经非常成熟。

The IC design method base on RTL has been widely used.

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