数字集成电路测试内容包括逻辑功能测试、直流参数测试和交流参数测试。
Digital IC test content includes logic functional test, test of DC parameters and test of AC parameters.
本文介绍了一种以MCS—51单片机为基础的TTL数字电路逻辑功能测试仪。
A new tester for the function of TTL digital circuit based on MCS-51 single chip computer is described.
对于更高级的用户，他们懂一点逻辑，懂得如何创建测试场景，可以使用编辑器和功能测试的领域特定语言去构造测试。
For more advanced users, who understand a little logic and how test scenarios should be created, they can use the editor to construct tests using a functional testing DSL (domain specific language).
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