该工具可实现对显微镜读数的处理及微观不平度十点高度和轮廓最大高度的计算。
The data by dual-microscope is handled and the point height of irregularities and maximum height of the profile are calculated by this tool.
通过扫描电子显微镜（SEM）和表面轮廓仪分析配副材料的磨痕表面形貌。
The morphology of worn surface was analyzed via scanning electron microscope (SEM) and by using a surface profilometer.
简要介绍了评定表面粗糙度参数的基准线及其主要的两个轮廓高度评定参数，详细阐述了重庆大学研制成功的一种高精度原子力显微镜——AFM。
The datum line and mainly three profile height parameters of surface roughness are briefly introduced and the operation principle and system structure of AFM.
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