研究了基于微电子测试的双桥结构图形，功能成品率模型参数提取的优化方法。

Then, based on the double bridge test structure, an optimization method is presented which is used to extracting the parameters of yield model fast and effectively.

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基于微电子测试双桥结构，本文给出了缺陷特征参数提取方法。

Based on the double bridge structure of microelectronics test pattern, the method of defect model parameter extraction is presented in this paper.

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该论文对相关的特征提取与匹配方法进行了简要介绍，主要关注的问题是运动参数和结构的计算，即运动估计部分。

The dissertation introduces the polular methods of feature extracting and matching briefly, while focuses on motion and structure parameters estimation.

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