闭锁继电器采用了一个电流脉冲进行激励，因此其热电漂移非常小。
Latching relays use a pulse of current to actuate them, so they have very low thermoelectric drift.
本文通过电流注入法对某型直流固态继电器输入端与输出端的电磁脉冲损伤机制进行了实验研究，确定了两种失效模式。
The electromagnetic pulse(EMP) damage mechanism and failure modes are obtained for the input port and output port of solid state relays by current injection method.
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