主要对卡圈结构的连接器的失效模式和机理进行了分析，并对如何提高卡圈结构的连接器的可靠性提出了多项改进方案。
The failure mode and mechanism of connectors with spring clip structure are analysed, and some improvement Suggestions for enhancing the reliability of this kind of connectors are presented.
详细介绍了半导体制冷器的失效机理、可靠性和寿命。
The failure mechanism. reliability and lifetime of semiconductor refrigerator are introduced in detail.
在进行失效机理深入分析和可靠性试验的基础上，确立自下而上的设计思路，介绍了各种新的设计方法。
This paper presents the design idea from bottom to top, and introduces various new design methods on the basis of analysis of failure mechanism and the reliability test.
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