本文主要是对大规模、超大规模集成电路寄存器传输级(RTL)的自动测试产生算法进行研究。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
本文主要是对大规模、超大规模集成电路寄存器传输级(RTL)的自动测试产生算法进行研究。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
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