实验发现，随增感条件的不同，增感中心发生了由空穴陷阱作用向深电子陷阱作用的转变。
It is found that the trap effect of the sensitization centers varies from the hole trap to deep electron trap with the change of sensitization conditions.
这一方法所考虑的模型比较接近实际情况，并能快速而方便地分别测得电子陷阱和空穴陷阱的能级密度。
The model of this method is very close to the real condition. It is convenient and quick to obtain the trap densities of electron and hole separately by this ne...
然后对不同应力电压、不同沟道长度下氧化层陷阱电荷（包括空穴和电子陷阱俘获）的产生做了进一步的分析。
Thus, the relationships of oxide charge generation, including electron trapping and hole trapping effects, with different stress voltages and channel lengths are analyzed.
然后对不同应力电压、不同沟道长度下氧化层陷阱电荷（包括空穴和电子陷阱俘获）的产生做了进一步的分析。
Thus, the relationships of oxide charge generation, including electron trapping and hole trapping effects, with different stress voltages and channel lengths are analyzed.
应用推荐