• 卢瑟福背散射分析基本原理了概要的介绍。

    The essential principle of Rutherford backscattering analysis is explained briefly.

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  • 卢瑟福背散射谱分析稀土离子多孔薄膜中的分布情况

    The distribution of rare earth ions embedded into porous silicon films was observed by Rutherford backscattering spectrometry.

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  • 工作用卢瑟福背散射研究离子束混合方法形成硅化条件

    The conditions of forming tungsten silicide with As ion beam mixing have been studied by means of Rutherford backscattering.

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  • 离子注入后进行氧化试验,结合X射线衍射瑟福散射进行了分析

    X ray diffraction and Rutherford Back Scattering techniques were adopted to investigate and analyze the oxidation characteristics of the films.

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  • 卢瑟福散射分析结果表明两种原子密度沿厚度方向呈梯度变化

    Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.

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  • 卢瑟福散射分析结果表明两种原子密度沿厚度方向呈梯度变化

    Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.

    youdao

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