The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The implanted samples were analyzed using X ray diffractometer (XRD) and X ray photoelectron spectrometer (XPS).
注入后的样品用X射线衍射方法(XRD)以及光电子能谱方法(XPS)进行分析。
METHODS: Study on the microstructure of Indigo Naturals with scanning electron microscope (SEM) and X ray diffractometer (XRD) were carried out.
方法:通过扫描电子显微镜(sem)和x衍射(XRD)方法,对青黛的微观结构进行了研究。
The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。
The microstructure of carbon fibers has been studied using X-ray diffractometer (XRD), transmission electron microscope (TEM) and high-resolution transmission electron microscope (HRTEM).
利用X射线衍射(XRD)、透射电子显微镜(TEM)、高分辨电子显微镜(H RTEM)研究了碳纤维的微观结构。
The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).
通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。
The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).
通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。
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