• The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).

    使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子显微镜(afm)对薄膜结构进行了分析。

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  • The implanted samples were analyzed using X ray diffractometer (XRD) and X ray photoelectron spectrometer (XPS).

    注入后的样品X射线衍射方法(XRD)以及光电子能谱方法(XPS)进行分析。

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  • METHODS: Study on the microstructure of Indigo Naturals with scanning electron microscope (SEM) and X ray diffractometer (XRD) were carried out.

    方法通过扫描电子显微镜(sem)x衍射(XRD)方法,对微观结构进行研究

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  • The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).

    所得产物X射线衍射仪(XRD)扫描电子显微镜(SEM)进行了表征。

    youdao

  • The microstructure of carbon fibers has been studied using X-ray diffractometer (XRD), transmission electron microscope (TEM) and high-resolution transmission electron microscope (HRTEM).

    利用X射线衍射(XRD)、透射电子显微镜(TEM)、高分辨电子显微镜(H RTEM)研究碳纤维微观结构

    youdao

  • The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).

    通过透射电镜(tem)x -射线衍射仪(XRD)所得片状银粉产物进行了表征

    youdao

  • The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).

    通过透射电镜(tem)x -射线衍射仪(XRD)所得片状银粉产物进行了表征

    youdao

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