在查看失败报告之前，您是否注意到单元测试运行速度很快，而在运行集成测试时会有明显的延迟？

Before you view the failing report, did you notice how quickly the unit tests ran, as well as the noticeable delay in running the integration tests?

youdao

该扫描路径上的延迟减少对外部缓冲器的需求，进而在集成电路扫描测试时避免保持时间违反。

The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.

youdao

该扫描路径上的延迟减少对外部缓冲器的需求，进而在集成电路扫描测试时避免保持时间违反。

The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.

youdao