The SCAN operation is a basic block for building other parallel algorithms. This paper first describes SCAN operations and the design of their sequential and parallel algorithms.
SCAN算法是构成某些并行算法的一个简单而常用的基本模块．本文首先描述了SCAN操作及其串行和并行算法的设计；
This paper regards narrow fan-beam scan mode as multi-detector parallel beam scan mode.
本论文将窄角扇束扫描看成是多探头的平行束扫描。
Each scan group is selected in turn by decoder so that storage elements in each scan group can be controlled and observed in parallel.
该结构采用译码的方式依次选通每个扫描小组，使得扫描小组中的存储元件并行地控制和观测。
A pattern generator coupled to the single memory manipulates the parallel test vectors used during the parallel test mode and the parallel and scan test vectors used during the scan test mode.
耦合到单个存储器的模式发生器操纵在并行测试方式过程中使用的并行测试矢量和在扫描测试方式过程中使用的并行和扫描测试矢量。
A switch is used to change from the parallel test mode to the scan test mode.
开关用于从并行测试方式改变为扫描测试方式。
The optical system moves in translation parallel to the rotational axis (22) to scan the sample.
光学系统在平行于转动轴方向(22)上平位移动以便扫描该样本。
The optical system moves in translation parallel to the rotational axis (22) to scan the sample.
光学系统在平行于转动轴方向(22)上平位移动以便扫描该样本。
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