一种集成电路包含存储器单元结构，其包含第一单元以及第二单元。
The first cell includes a first storage structure and a first gate over a substrate.
集成电路工艺的改进使存储器的测试面临着更大的挑战。
Test of memory faces enormous challenge because of the semiconductor technology progress.
集成电路工艺的改进使存储器的测试面临着更大的挑战。
Test of memory faces enormous challenge because of the semiconductor technology progress.
应用推荐