Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.
另外，本文还针对IP核投片测试提出一种扫描测试电路结构，能够实现测试芯片的扫描测试和高速内建自测试(BIST)。
It was proved by test that the high-speed detection circuit has better ability and is feasible to apply the high speed detection circuit in FOG with short fiber.
测试结果表明：高速检测电路比普通检测电路具有更高的性能，其应用于短光纤光纤陀螺的方案是可行的。
This paper presents a high speed test generation method specifically for upper large scale combination circuit (ULSCC) and full scan designed circuit.
针对特大规模组合电路和全扫描设计电路提出了一种高速测试生成方法。
The high speed digital testing module is mostly used in test of digital circuit or digital system.
高速数字测试模块主要用于数字板卡和数字系统的测试。
Aiming at the mixed-signal circuit testing, an integrated built-in self test (BIST) architecture for testing on-chip high speed ADC was presented.
针对混合信号电路的测试问题，提出了一种内建自测试(BIST)结构，分析并给出了如何利用该结构来计算片上高速模数转换器(adc)的静态参数。
The intensity of a pulse emitting laser can be controlled constantly and continuously while recording data without using test emissions or a high speed sample hold circuit.
对在记录数据时处于脉冲发光状态的激光，不用试验发光或高速抽样保持电路，就能经常连续地控制其强度。
The intensity of a pulse emitting laser can be controlled constantly and continuously while recording data without using test emissions or a high speed sample hold circuit.
对在记录数据时处于脉冲发光状态的激光，不用试验发光或高速抽样保持电路，就能经常连续地控制其强度。
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